Published September 26, 2012
| Version v1
Journal article
Growth of atomically thin hexagonal boron nitride films by diffusion through a metal film and precipitation
- 1. NTT Basic Research Laboratories, Atsugi, Kanagawa 243-0198 (Japan)
Description
Atomically thin hexagonal boron nitride films were grown on both the top and bottom surfaces of a polycrystalline Co or Ni film by annealing a Co (Ni)/amorphous boron nitride/SiO2 structure in vacuum. This method of growing hexagonal boron nitride is much simpler than other methods, such as thermal chemical vapour deposition. B and N atoms diffuse through the metal film, although N is almost completely insoluble in both Co and Ni, and precipitation occurs at the topmost surface. The mass transport is considered to be caused by grain boundary diffusion.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/45/38/385304Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 45
- Journal Issue
- 38
- Journal Page Range
- [9 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44041184
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; ANNEALING; ATOMS; BORON NITRIDES; CHEMICAL VAPOR DEPOSITION; COBALT; DIFFUSION; FILMS; GRAIN BOUNDARIES; MASS; METALS; NICKEL; POLYCRYSTALS; PRECIPITATION; SILICON OXIDES
- Descriptors DEC
- BORON COMPOUNDS; CHALCOGENIDES; CHEMICAL COATING; CRYSTALS; DEPOSITION; ELEMENTS; HEAT TREATMENTS; METALS; MICROSTRUCTURE; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; SEPARATION PROCESSES; SILICON COMPOUNDS; SURFACE COATING; TRANSITION ELEMENTS