Published June 2010
| Version v1
Journal article
External beamline setup for plated target investigation
- 1. Jozef Stefan Institute, Jamova cesta 39, Ljubljana SI-1001 (Slovenia)
- 2. Faculty of Mathematics and Physics, University of Ljubljana, Jadranska cesta 19, Ljubljana SI-1001 (Slovenia)
Description
The in-air beamline at the microanalytical center of the Jozef Stefan Institute in Slovenia has recently been upgraded with a wire-mesh current-integration normalization device and a RBS detector in helium flush. For positioning of the targets, the laser-triangulation with 40 μm repeatability was realized using 100 μm wide laser beam and a static camera. Metal plated historical objects were investigated for their gilded and tinned surfaces. Artificial samples were produced by dip-tinning and compared with archaeological samples. A surface roughness was found to be an important parameter for fitting the spectra by the SIMNRA software.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2010.02.118Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2010.02.118;
- PII
- S0168-583X(10)00213-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 268
- Journal Issue
- 11-12
- Journal Page Range
- p. 2006-2009
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 19. international conference on ion beam analysis
- Dates
- 7-11 Sep 2009
- Place
- Canbridge (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42015001
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AIR; CAMERAS; COATINGS; COMPUTER CODES; HELIUM; LASERS; METALS; MICROANALYSIS; PHOTON BEAMS; ROUGHNESS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTRA; SURFACES
- Descriptors DEC
- BEAMS; ELEMENTS; FLUIDS; GASES; NONMETALS; RARE GASES; SPECTROSCOPY; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.