Published June 2010 | Version v1
Journal article

External beamline setup for plated target investigation

  • 1. Jozef Stefan Institute, Jamova cesta 39, Ljubljana SI-1001 (Slovenia)
  • 2. Faculty of Mathematics and Physics, University of Ljubljana, Jadranska cesta 19, Ljubljana SI-1001 (Slovenia)

Description

The in-air beamline at the microanalytical center of the Jozef Stefan Institute in Slovenia has recently been upgraded with a wire-mesh current-integration normalization device and a RBS detector in helium flush. For positioning of the targets, the laser-triangulation with 40 μm repeatability was realized using 100 μm wide laser beam and a static camera. Metal plated historical objects were investigated for their gilded and tinned surfaces. Artificial samples were produced by dip-tinning and compared with archaeological samples. A surface roughness was found to be an important parameter for fitting the spectra by the SIMNRA software.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2010.02.118

Additional details

Identifiers

DOI
10.1016/j.nimb.2010.02.118;
PII
S0168-583X(10)00213-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
268
Journal Issue
11-12
Journal Page Range
p. 2006-2009
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
19. international conference on ion beam analysis
Dates
7-11 Sep 2009
Place
Canbridge (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42015001
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AIR; CAMERAS; COATINGS; COMPUTER CODES; HELIUM; LASERS; METALS; MICROANALYSIS; PHOTON BEAMS; ROUGHNESS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTRA; SURFACES
Descriptors DEC
BEAMS; ELEMENTS; FLUIDS; GASES; NONMETALS; RARE GASES; SPECTROSCOPY; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.