Published December 15, 1983
| Version v1
Journal article
Low-energy ion scattering from the Si(111) surface: Analysis of the clean 7 x 7 and Te-stabilized ''1 x 1'' structures
Creators
- 1. National Inst. for Researches in Inorganic Materials, Sakura, Ibaraki (Japan)
Description
For the clean 7x7 and Te-stabilized '1x1' structure of the Si(111) surface, the following models are proposed on the basis of specialized low-energy, ion scattering experiments. The 7x7 and '1x1' structures are constructed by ordered and disordered pyramidal clusters of adatoms, respectively. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 218
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 241-247
- ISSN
- 0167-5087
Conference
- Title
- 6. international conference on ion beam analysis (IBA-6).
- Dates
- 23-27 May 1983.
- Place
- Tempe, AZ (USA).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 15047836
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ANGULAR DISTRIBUTION; EXPERIMENTAL DATA; ION SCATTERING ANALYSIS; SILICON; STRUCTURAL MODELS; SURFACES; TELLURIUM ADDITIONS; THEORETICAL DATA
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; DISTRIBUTION; ELEMENTS; INFORMATION; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; SEMIMETALS
Optional Information
- Notes
- With 31 refs.