Study of low multiplicity electron source LEETECH with diamond detector

In this paper, we present experimental and numerical studies of the calibration of low-multiplicity electron source using signals from electrons incident on a diamond detector. The experiments were performed at the newly commissioned versatile LEETECH platform at the PHIL photoinjector facility at LAL. We show that with a single crystal CVD diamonds of 500 micrometers thickness, the energy losses from the first three electrons of 2.5–3 MeV are clearly resolved. The described technique can be used as a complementary approach for calibration of diamond detectors as well as for diagnostics of accelerated beam halos in a regime down to a few particles.