Preparation and characterization of amorphous manganese sulfide thin films by SILAR method
- 1. Eco-Nano Research Center, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul 130-650 (Korea, Republic of)
- 2. Department of Chemistry, Hanyang University, Sungdong-Ku, Haengdang-dong, 17, Seoul 133-791 (Korea, Republic of)
- 3. Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416004 (India)
Description
Manganese sulfide thin films were deposited by a simple and inexpensive successive ionic layer adsorption and reaction (SILAR) method using manganese acetate as a manganese and sodium sulfide as sulfide ion sources, respectively. Manganese sulfide films were characterized for their structural, surface morphological and optical properties by means of X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis and optical absorption measurement techniques. The as-deposited film on glass substrate was amorphous. The optical band gap of the film was found to be thickness dependent. As thickness increases optical band gap was found to be increase. The water angle contact was found to be 34o, suggesting hydrophilic nature of manganese sulfide thin films. The presence of Mn and S in thin film was confirmed by energy dispersive X-ray analysis
Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2006.11.017;
- PII
- S0025-5408(06)00451-X;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 42
- Journal Issue
- 8
- Journal Page Range
- p. 1565-1569
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39025454
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACETATES; ADSORPTION; GLASS; ION SOURCES; MANGANESE; MANGANESE SULFIDES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SODIUM SULFIDES; SURFACE PROPERTIES; THICKNESS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CARBOXYLIC ACID SALTS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IONIZING RADIATIONS; MANGANESE COMPOUNDS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SODIUM COMPOUNDS; SORPTION; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.