Application of relativistic electrons for the quantitative analysis of trace elements

Particle Induced X-ray Emission methods (PIXE) have been extended to Relativistic Electrons to Induce X-ray Emission (REIXE) for quantitative trace-element analysis. The electron beam (20 <= E0 <= 70 MeV) was supplied by the Darmstadt electron linear accelerator DALINAC. Systematic measurements of absolute K-, L- and M- shell ionization cross sections revealed a scaling behaviour of inner-shell ionization cross sections from which X-ray production cross sections can be deduced for any element of interest for a quantitative sample investigation. Using a multielemental mineral Monazite sample from Malaysia the sensitivity of REIXE is compared to well established methods of trace-element analysis like proton- and X-ray induced X-ray fluorescence analysis. The achievable detection limit for very heavy elements amounts to about 100 ppm for the REIXE method. Two examples of applications are discussed, the quantitative target contamination analysis and the investigation of a sample prepared from Manganese nodules - picked up from the Pacific deep sea - which showed the expected high mineral content of Fe, Ni, Cu and Ti, although the search for aliquots of Pt did not show any measurable content within an upper limit of 250 ppm. (orig.)