Large scale nanopatterning of graphene
- 1. Budapest University of Technology and Economics (BUTE), Department of Physics, Solid State Physics Laboratory, Budapest H-1521, P.O. Box 91 (Hungary)
- 2. Research Institute for Technical Physics and Materials Science (MFA) of HAS, Korean-Hungarian Joint Laboratory for Nanosciences, Budapest H-1525, P.O. Box 49 (Hungary)
- 3. Research Institute for Solid State Physics and Optics of HAS, Budapest H-1525, P.O. Box 49 (Hungary)
Description
Recently, we have shown that the shaping of atomically perfect zig-zag oriented edges can be performed by exploiting the orientation dependent oxidation in graphene, by annealing the samples in inert atmosphere, where the oxygen source is the SiO2 substrate itself. In the present study, we showed that the large scale patterning of graphene using a conventional lithography technique can be combined with the control of crystallographic orientation and edge shaping. We applied electron beam lithography (EBL) followed by low energy O+/Ar+ plasma etching for patterning mechanically exfoliated graphene flakes. As AFM imaging of the samples revealed, the controlled oxidation transformed the originally circular holes to polygonal shape with edges parallel with the zig-zag direction, showing the possibility of atomically precise, large area patterning of graphene.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.08.044Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.08.044;
- PII
- S0168-583X(11)00835-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 282
- Journal Page Range
- p. 130-133
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- European Materials Research Society symposium B 'Ion beam synthesis and modification of nanostructured materials and surfaces'
- Acronym
- EMRS 2011
- Dates
- 9-13 May 2011
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44044112
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ARGON IONS; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; ELECTRON BEAMS; ETCHING; GRAIN ORIENTATION; GRAPHENE; HOLES; INERT ATMOSPHERE; OXIDATION; PLASMA; SILICON OXIDES; SUBSTRATES
- Descriptors DEC
- ATMOSPHERES; BEAMS; CARBON; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; CONTROLLED ATMOSPHERES; ELEMENTS; HEAT TREATMENTS; IONS; LEPTON BEAMS; MICROSCOPY; MICROSTRUCTURE; NONMETALS; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; SILICON COMPOUNDS; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.