Published July 1, 2012 | Version v1
Journal article

Large scale nanopatterning of graphene

  • 1. Budapest University of Technology and Economics (BUTE), Department of Physics, Solid State Physics Laboratory, Budapest H-1521, P.O. Box 91 (Hungary)
  • 2. Research Institute for Technical Physics and Materials Science (MFA) of HAS, Korean-Hungarian Joint Laboratory for Nanosciences, Budapest H-1525, P.O. Box 49 (Hungary)
  • 3. Research Institute for Solid State Physics and Optics of HAS, Budapest H-1525, P.O. Box 49 (Hungary)

Description

Recently, we have shown that the shaping of atomically perfect zig-zag oriented edges can be performed by exploiting the orientation dependent oxidation in graphene, by annealing the samples in inert atmosphere, where the oxygen source is the SiO2 substrate itself. In the present study, we showed that the large scale patterning of graphene using a conventional lithography technique can be combined with the control of crystallographic orientation and edge shaping. We applied electron beam lithography (EBL) followed by low energy O+/Ar+ plasma etching for patterning mechanically exfoliated graphene flakes. As AFM imaging of the samples revealed, the controlled oxidation transformed the originally circular holes to polygonal shape with edges parallel with the zig-zag direction, showing the possibility of atomically precise, large area patterning of graphene.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.08.044

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.08.044;
PII
S0168-583X(11)00835-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
282
Journal Page Range
p. 130-133
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
European Materials Research Society symposium B 'Ion beam synthesis and modification of nanostructured materials and surfaces'
Acronym
EMRS 2011
Dates
9-13 May 2011
Place
Nice (France)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.