Tracking multiple generation and suppression of secondary electrons on periodic triangular surface
Creators
- 1. Laboratory on Science and Technology of High Power Microwave, Northwest Institute of Nuclear Technology, Xi'an, Shaanxi 710024 (China)
- 2. Department of Engineering Physics, Tsinghua University, Beijing 10084 (China)
Description
To research the dynamic course of multipactor suppression on the periodically patterned surface, tens of electron collision processes are tracked by numerical calculation. The influences of microwave frequency, amplitude of RF electric field, slope angle, the local field enhancement, and the tilted incident electric field on the multipactor suppression are studied by tracking multi-generation electrons' trajectories, hopping and flight time, collision energy, and secondary emission yield. Meanwhile, the dynamic processes of secondary electrons on the periodic surface are analyzed by particle-in-cell (PIC) simulation. The PIC results are consistent with the analytical results in which the electrons fly reciprocatingly between the slopes and impact on the slopes; the methods of increasing the slope angle, enlarging the RF field, and lowering the frequency in a certain range are helpful to enhance the multipactor suppression steadily and persistently
Additional details
Identifiers
- DOI
- 10.1063/1.4831763;
Publishing Information
- Journal Title
- Physics of Plasmas
- Journal Volume
- 20
- Journal Issue
- 12
- Journal Page Range
- p. 123502-123502.7
- ISSN
- 1070-664X
- CODEN
- PHPAEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45039345
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- AMPLITUDES; COMPUTERIZED SIMULATION; ELECTRIC FIELDS; ELECTRON COLLISIONS; ELECTRON EMISSION; ELECTRONS; MICROWAVE RADIATION; PERIODICITY; PHOTON EMISSION; SECONDARY EMISSION
- Descriptors DEC
- COLLISIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; RADIATIONS; SIMULATION; VARIATIONS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC