Response of amorphous silicon p-i-n detectors to ionizing particles
- 1. Lab. de Physique Nucleaire, Univ. de Montreal, Quebec (Canada)
- 2. Lab. de Physique des Interfaces et des Couches Minces, Ecole Polytechnique, 91 - Palaiseau (France)
- 3. Lab. de Physique Corpusculair, Coll. de France, 75 - Paris (France)
Description
Prototypes of thin film p-i-n amorphous silicon detectors, having intrinsic layer thicknesses ranging from 3 to 18 μm, were designed and fabricated, and their response to protons of 1.3 to 11.6 MeV, and to α particles of 1.6 to 14.6 MeV was studied. The collection efficiency of the charges generated by a particle is found to decrease sharply with increasing dE/dx, for dE/dx values greater than 10 keV/μm. However, there exists a domain of oblique angles of incidence, relatively high applied biases and low dE/dx values over which the signal amplitude varies linearly with energy loss. Pulse shape studies show the signal to consist of a steep leading edge, attributed to prompt electron collection, and a slow component showing evidence of multiple-trapping transport of holes, which is a possible cause for incomplete collection of the generated charge at the maximum attainable field of 60 V/μm. Finally, all detectors give signal amplitudes compatible with a mean electron-hole pair creation energy of 3.4 to 4.4 eV in a-Si:H. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section B
- Journal Volume
- 54
- Journal Issue
- 4
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 458-471
- ISSN
- 0168-583X
- CODEN
- NIMBE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 22091627
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALPHA PARTICLES; AMORPHOUS STATE; EFFICIENCY; ENERGY LOSSES; ENERGY-LEVEL DENSITY; HYDROGEN ADDITIONS; INELASTIC SCATTERING; MEV RANGE 01-10; MEV RANGE 10-100; SI SEMICONDUCTOR DETECTORS; SILICON; THICKNESS; THIN FILMS; TIME DEPENDENCE; TRAPPING
- Descriptors DEC
- CHARGED PARTICLES; DIMENSIONS; ELEMENTS; ENERGY RANGE; FILMS; HELIUM IONS; IONIZING RADIATIONS; IONS; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SEMIMETALS