Published July 2009 | Version v1
Journal article

Three-dimensional automated micromanipulation using a nanotip gripper with multi-feedback

  • 1. Institut des Systèmes Intelligents et de Robotique, Université Pierre et Marie Curie/CNRS, 4 Place Jussieu, Paris Cedex (France)

Description

In this paper, three-dimensional (3D) automated micromanipulation at the scale of several micrometers using a nanotip gripper with multi-feedback is presented. The gripper is constructed from protrudent tips of two individually actuated atomic force microscope cantilevers; each cantilever is equipped with an optical lever. A manipulation protocol allows these two cantilevers to form a gripper to pick and place micro-objects without adhesive-force obstacles in air. For grasping, amplitude feedback from the dithering cantilever with its normal resonant frequency is used to search a grasping point by laterally scanning the side of the microspheres. Real-time force sensing is available for monitoring the whole pick-and-place process with pick-up, transport and release steps. For trajectory planning, an algorithm based on the shortest path solution is used to obtained 3D micropatterns with high levels of efficiency. In experiments, 20 microspheres with diameters from 3 µm to 4 µm were manipulated and 5 3D micropyramids with two layers were built. Three-dimensional micromanipulation and microassembly at the scale of several microns to the submicron scale could become feasible through the newly developed 3D micromanipulation system with a nanotip gripper

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/19/7/075009

Additional details

Identifiers

DOI
10.1088/0960-1317/19/7/075009;
PII
S0960-1317(09)10426-6;

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
19
Journal Issue
7
Journal Page Range
[9 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45007800
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; EFFICIENCY; LAYERS; MICROSPHERES; MONITORING; THREE-DIMENSIONAL CALCULATIONS
Descriptors DEC
MICROSCOPY