Published November 2010 | Version v1
Journal article

Surface effects on the magnetic properties of Co2FeAl(0 0 1): An ab initio study

  • 1. State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083 (China)
  • 2. Department of Applied Physics, Xi'an Jiaotong University, Xi'an 710049 (China)

Description

Electronic structures of the Co2FeAl(0 0 1) surface are studied theoretically via first-principles calculations based on density functional theory. It is found that the minority spin band gap at the Fermi level in bulk Co2FeAl disappears at the surface due to space localization of the states. However, beneath the surface, the density of states of individual atoms shows a trend of minority spin gap opening at the Fermi level, which indicates that the electronic structures become close to that of bulk Co2FeAl. The termination of FeAl is more favorable for spin polarization of Co2FeAl films than that of Co. Accordingly, we present a composite tri-layer model to illustrate the fading of the half-metallic property in Co2FeAl films against the ideal character in bulk materials.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2010.06.024

Additional details

Identifiers

DOI
10.1016/j.jmmm.2010.06.024;
PII
S0304-8853(10)00405-1;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
322
Journal Issue
21
Journal Page Range
p. 3351-3354
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42048900
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM ALLOYS; COBALT ALLOYS; DENSITY FUNCTIONAL METHOD; ELECTRONIC STRUCTURE; FERMI LEVEL; FILMS; IRON ALLOYS; LAYERS; MAGNETIC PROPERTIES; SPIN ORIENTATION; SURFACES
Descriptors DEC
ALLOYS; CALCULATION METHODS; ENERGY LEVELS; ORIENTATION; PHYSICAL PROPERTIES; TRANSITION ELEMENT ALLOYS; VARIATIONAL METHODS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.