Published May 2010
| Version v1
Journal article
Tuning the magnetic properties of Zn1-xCoxO films
Creators
- 1. Fachbereich Physik, Universitaet Duisburg-Essen and CeNIDE, 47057 Duisburg (Germany)
- 2. Fundamental and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA 99352 (United States)
- 3. European Synchrotron Radiation Facility (ESRF), 38043 Grenoble (France)
Description
We compare the magnetic properties of two types of Co-doped ZnO films grown on sapphire with distinct structural quality. SQUID magnetometry as well as element-specific synchrotron studies reveal pure paramagnetic behavior for the samples with the highest structural quality, whereas samples with reduced structural quality exhibit superparamagnetic blocking behavior. In this sample signatures of phase separation are detected by X-ray diffraction and X-ray linear dichroism which accounts for the superparamagnetic blocking.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2009.04.024Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2009.04.024;
- PII
- S0304-8853(09)00422-3;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 322
- Journal Issue
- 9-12
- Journal Page Range
- p. 1232-1234
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- Joint European magnetic symposia
- Dates
- 14-19 Sep 2008
- Place
- Dublin (Ireland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41089109
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; COMPARATIVE EVALUATIONS; DOPED MATERIALS; FILMS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; SAPPHIRE; SQUID DEVICES; SUPERPARAMAGNETISM; SYNCHROTRONS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- ACCELERATORS; CHALCOGENIDES; COHERENT SCATTERING; CORUNDUM; CYCLIC ACCELERATORS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; FLUXMETERS; IONIZING RADIATIONS; MAGNETISM; MATERIALS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; SUPERCONDUCTING DEVICES; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.