Multilayer mirrors for use in the energy range of 1-8 keV
- 1. Japan Atomic Energy Agency, Quantum Beam Science Directorate, Kizu, Kyoto (Japan)
- 2. Shimadzu Emit Co., Ltd., Osaka (Japan)
- 3. Center for X-Ray Optics, Lawrence Berkeley National Lab., Berkeley, CA (United States)
Description
We have fabricated and evaluated the multilayer mirrors for use in the energy range of 1-8 keV. As a result of theoretical investigation, we have found that Co/Si and Co/SiO2 multilayers show relatively high reflectivity. We have fabricated the Co/Si and Co/SiO2 multilayers by means of an ion beam sputtering method, and evaluated the layer structures and optical properties of the fabricated multilayers. A simulation calculation for the Co/Si multilayer implies large inter diffusion layers. The inter diffusion layers cause the degradation of optical contrasts of the layer boundaries, so that the reflectivity of Co/Si multilayer decrease. Roughnesses of the Co/SiO2 multilayer are larger than those of the Co/Si multilayer, but it is possible that x-ray reflectivity can be increased by using SiO2 instead of Si. (author)
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the joint meeting of ultrafast pulse high intensity laser research collaboration and JAEA-KPSI 7th symposium on advanced photon research
- Imprint Pagination
- 259 p.
- Journal Page Range
- p. 225-228
- Report number
- JAEA-Conf--2007-001
Conference
- Title
- Joint meeting of ultrafast pulse high intensity laser research collaboration; 7. JAEA-KPSI symposium on advanced photon research
- Dates
- 10-12 May 2006
- Place
- Kizu, Kyoto (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 38102285
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRAGG CURVE; COBALT; COMPUTERIZED SIMULATION; ION BEAMS; KEV RANGE 01-10; LAYERS; MIRRORS; PERFORMANCE TESTING; REFLECTIVITY; ROUGHNESS; SILICON; SILICON OXIDES; SPUTTERING; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; CHALCOGENIDES; COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; INFORMATION; KEV RANGE; METALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SIMULATION; SURFACE PROPERTIES; TESTING; TRANSITION ELEMENTS
Optional Information
- Notes
- 10 refs., 3 figs.