Amorphous silicon image sensors for x-ray detection in NDT
Description
Acquiring radiographic images in a digital format offers significant advantages over film. Besides eliminating the need for chemical processing, a digital image can be easily stored for more convenient retrieval, transmitted to remote locations for interpretation, and image processed to provide enhanced interpretation and greater latitude in exposure. Amorphous silicon image sensors, developed by dpiX, a Xerox Company, offer an improved method of acquiring digital x-ray images. Amorphous silicon image sensor technology provides the opportunity to have large format size similar to x-ray film, high resolution, and a compact package for ease of use in NDT applications. This technology can also be used to replace x-ray image intensifier tubes to provide real-time fluoroscopic imaging for capturing time related events such as x-ray examination of objects on a conveyor belt. This paper presents a description of amorphous silicon image sensor technology and provides examples of the performance that can be achieved using a system that has an 8 x 10 inch x-ray image acquisition area and 127 micron pixels for 4 lp/mm resolution
Additional details
Publishing Information
- Publisher
- American Society for Nondestructive Testing.
- Imprint Place
- Columbus, OH (United States)
- ISBN
- 1-57117-053-7
- Imprint Title
- ASNT 1996 fall conference and quality testing show: Paper summaries
- Imprint Pagination
- 246 p.
- Journal Page Range
- p. 200-202.
Conference
- Title
- 1996 Fall conference and quality testing show. NDT - new horizons on the Pacific.
- Dates
- 14-18 Oct 1996.
- Place
- Seattle, WA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29012594
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA ACQUISITION SYSTEMS; DIGITAL SYSTEMS; IMAGES; NONDESTRUCTIVE TESTING; SI SEMICONDUCTOR DETECTORS; X-RAY DETECTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- DETECTION; MATERIALS TESTING; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TESTING
Optional Information
- Secondary number(s)
- CONF-9610109--.