Published January 1981 | Version v1
Journal article

Role of disorder in maximizing the upper critical field in the Nb-Sn system

Description

The transition temperature T/sub c/, upper critical field H/sub c2/(T) and the resistivity above T/sub c/ were measured in thin films of electron beam co-evaporated Nb-Sn which were deposited as Nb/sub 3/Sn at various substrate temperatures, or off-stoichiometry, or with tertiary additions of Al or Zr. The T/sub c/ and H/sub c2/ correlate with the resistivity, no matter how the materials were made. 6 refs

Additional details

Publishing Information

Journal Title
IEEE Trans. Magn.
Journal Volume
MAG-17
Journal Issue
1
Series
IEEE Trans. Magn.
Journal Page Range
368-369
ISSN
0018-9464

Conference

Title
Applied superconductivity conference.
Dates
29 Sep - 2 Oct 1980.
Place
Santa Fe, NM, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
12640871
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CRITICAL FIELD; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; NIOBIUM BASE ALLOYS; PHASE STUDIES; SUPERCONDUCTING COMPOSITES; TIN ALLOYS; TRANSITION TEMPERATURE
Descriptors DEC
ALLOYS; COMPOSITE MATERIALS; DATA; ELECTRICAL PROPERTIES; INFORMATION; MAGNETIC FIELDS; NIOBIUM ALLOYS; NUMERICAL DATA; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS

Optional Information

Secondary number(s)
CONF-800980--.