Published January 1981
| Version v1
Journal article
Role of disorder in maximizing the upper critical field in the Nb-Sn system
Creators
- 1. Stanford Univ, Calif
Description
The transition temperature T/sub c/, upper critical field H/sub c2/(T) and the resistivity above T/sub c/ were measured in thin films of electron beam co-evaporated Nb-Sn which were deposited as Nb/sub 3/Sn at various substrate temperatures, or off-stoichiometry, or with tertiary additions of Al or Zr. The T/sub c/ and H/sub c2/ correlate with the resistivity, no matter how the materials were made. 6 refs
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Magn.
- Journal Volume
- MAG-17
- Journal Issue
- 1
- Series
- IEEE Trans. Magn.
- Journal Page Range
- 368-369
- ISSN
- 0018-9464
Conference
- Title
- Applied superconductivity conference.
- Dates
- 29 Sep - 2 Oct 1980.
- Place
- Santa Fe, NM, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12640871
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CRITICAL FIELD; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; NIOBIUM BASE ALLOYS; PHASE STUDIES; SUPERCONDUCTING COMPOSITES; TIN ALLOYS; TRANSITION TEMPERATURE
- Descriptors DEC
- ALLOYS; COMPOSITE MATERIALS; DATA; ELECTRICAL PROPERTIES; INFORMATION; MAGNETIC FIELDS; NIOBIUM ALLOYS; NUMERICAL DATA; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Secondary number(s)
- CONF-800980--.