Ferroelectric and piezoelectric properties of lead-free BaTiO3 doped Bi0.5Na0.5TiO3 thin films from metal-organic solution deposition
Creators
- 1. Department of Semiconductor Science and Technology, Basic Research Laboratory (BRL), Semiconductor Physics Research Center (SPRC), Chonbuk National University, Jeonju 561–756 (Korea, Republic of)
- 2. Division of Advanced Materials Engineering, Hydrogen and Fuel Cell Research Center, Chonbuk National University, Jeonju 561–756 (Korea, Republic of)
Description
Highlights: ► Lead-free BNT–BT thin films from an optimized metal-organic solution deposition. ► Phase and microstructure evolution with annealing temperature. ► A relatively low leakage current density. ► Good dielectric constant of 613 at a frequency of 1 kHz. ► High remanent polarization and piezoelectric constant comparable to PZT thin films. - Abstract: Lead-free 0.94Bi0.5Na0.5TiO3–0.06BaTiO3 (BNT–BT) piezoelectric thin films were prepared by metal-organic solution deposition onto a Pt/Ti/SiO2/Si substrate. A dense and well crystallized thin film with a perovskite phase was obtained by annealing these films at 700 °C. Atomic force microscopy showed that these films were smooth and crack-free with an average grain size on the order of 200 nm. Thin films of 356 nm thickness exhibited a small signal dielectric constant and a loss tangent at 1 kHz of 613 and 0.044, respectively. Ferroelectric hysteresis measurements indicated a remanent polarization value of 21.5 μC/cm2 with a coercive field of 164.5 kV/cm. The leakage current density of the thin film was 4.08 × 10−4 A/cm2 at an applied electric field of 200 kV/cm. A typical butterfly-shaped piezoresponse loop was observed and the effective piezoelectric coefficient (d33) of the BNT–BT thin film was approximately 51.6 pm/V.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2012.06.071Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2012.06.071;
- PII
- S0925-8388(12)01053-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 540
- Journal Page Range
- p. 204-209
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44090932
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DENSITY; DEPOSITION; DOPED MATERIALS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; GRAIN SIZE; LEAKAGE CURRENT; PERMITTIVITY; PEROVSKITE; PIEZOELECTRICITY; SILICON OXIDES; SUBSTRATES; THICKNESS; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CURRENTS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRICITY; FILMS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PEROVSKITES; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SIZE
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.