Application of isotopic-spectral method for determination of carbon and sulphur in silicate materials
- 1. Leningradskij Gosudarstvennyj Univ., Leningrad (Russian Federation). Nauchno-Issledovatel'skij Fizicheskij Inst.
Description
Isotopic balancing of carbon and sulphur is carried out in temperature ranges 1500-1900 K and 700-800 K, respectively. Relative intensities of electron-vibrational band heads of 13CO/12CO and 34SO/32SO molecules excited in HF electrodeless discharge in the quartz capillaries are measured. Isotopic concentration is determined. Experimental conditions are optimised and the ratio of analytical signal to background (quantity and pressure of analysed gas, degree of its dilution by inert gas etc.) is improved. Carbon in natural and synthetic silica as well as C and S in geological samples are determined. Limits of detection of C and S concentrations is ∼ 10-5 and ∼ 10-4 % mass., respectively. A precision 5-10 % RSD is achieved in the concentration range from ∼ 10-4 to ∼ 10-3 % mass. (author)
Additional details
Additional titles
- Subtitle (English)
- Poster W2
Publishing Information
- Imprint Title
- XXVI colloquium spectroscopicum internationale. Abstracts. Vol. 3
- Imprint Pagination
- 214 p.
- Journal Page Range
- p. 111-112.
Conference
- Title
- 26. colloquium spectroscopicum internationale (CSI) and instrument exhibition.
- Dates
- 2-9 Jul 1989.
- Place
- Sofia (Bulgaria).
INIS
- Country of Publication
- Bulgaria
- Country of Input or Organization
- Bulgaria
- INIS RN
- 24056177
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Numerical Data, Non-conventional Literature
- Descriptors DEI
- CARBON ISOTOPES; CONCENTRATION RATIO; EXCITATION; EXPERIMENTAL DATA; ISOTOPE RATIO; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; SILICATES; SPECTROSCOPY; SULFUR ISOTOPES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; ENERGY-LEVEL TRANSITIONS; INFORMATION; NUMERICAL DATA; OXYGEN COMPOUNDS; SILICON COMPOUNDS; TEMPERATURE RANGE