Published 1989 | Version v1
Miscellaneous

Application of isotopic-spectral method for determination of carbon and sulphur in silicate materials

  • 1. Leningradskij Gosudarstvennyj Univ., Leningrad (Russian Federation). Nauchno-Issledovatel'skij Fizicheskij Inst.

Description

Isotopic balancing of carbon and sulphur is carried out in temperature ranges 1500-1900 K and 700-800 K, respectively. Relative intensities of electron-vibrational band heads of 13CO/12CO and 34SO/32SO molecules excited in HF electrodeless discharge in the quartz capillaries are measured. Isotopic concentration is determined. Experimental conditions are optimised and the ratio of analytical signal to background (quantity and pressure of analysed gas, degree of its dilution by inert gas etc.) is improved. Carbon in natural and synthetic silica as well as C and S in geological samples are determined. Limits of detection of C and S concentrations is ∼ 10-5 and ∼ 10-4 % mass., respectively. A precision 5-10 % RSD is achieved in the concentration range from ∼ 10-4 to ∼ 10-3 % mass. (author)

Part of:
XXVI colloquium spectroscopicum internationale

Additional details

Additional titles

Subtitle (English)
Poster W2

Publishing Information

Imprint Title
XXVI colloquium spectroscopicum internationale. Abstracts. Vol. 3
Imprint Pagination
214 p.
Journal Page Range
p. 111-112.

Conference

Title
26. colloquium spectroscopicum internationale (CSI) and instrument exhibition.
Dates
2-9 Jul 1989.
Place
Sofia (Bulgaria).

INIS

Country of Publication
Bulgaria
Country of Input or Organization
Bulgaria
INIS RN
24056177
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Numerical Data, Non-conventional Literature
Descriptors DEI
CARBON ISOTOPES; CONCENTRATION RATIO; EXCITATION; EXPERIMENTAL DATA; ISOTOPE RATIO; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; SILICATES; SPECTROSCOPY; SULFUR ISOTOPES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K
Descriptors DEC
CHEMICAL ANALYSIS; DATA; ENERGY-LEVEL TRANSITIONS; INFORMATION; NUMERICAL DATA; OXYGEN COMPOUNDS; SILICON COMPOUNDS; TEMPERATURE RANGE

Optional Information