Published December 1, 2018 | Version v1
Journal article Metadata-only

Investigation of Statistical Broadening in InGaN Alloys

Creators

  • 1. Ioffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg (Russian Federation)
  • 2. Submicron Heterostructures for Microelectronics, Research & Engineering Center, RAS, 26 Politekhnicheskaya, 194021 St. Petersburg (Russian Federation)

Description

Optical and structural properties of thick InGaN layers grown by MOCVD and MBE were studied by photoluminescence, optical transmission and Raman spectroscopies and X-ray diffraction analysis. Optical bandgap, Urbach energy, and full widths at half maximum (FWHM) of photoluminescence and Raman spectra depending on the InGaN alloy composition were determined experimentally. Minimal theoretical linewidth of photoluminescence spectra resulted from random distribution of In and Ga atoms in cation sublattice was calculated. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1135/1/012050

Additional details

Identifiers

DOI
10.1088/1742-6596/1135/1/012050;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1135
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
International Conference PhysicA.SPb/2018
Dates
23-25 Oct 2018
Place
Saint Petersburg (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53035959
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; ATOMS; CATIONS; CHEMICAL VAPOR DEPOSITION; LINE WIDTHS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; RAMAN SPECTRA; RAMAN SPECTROSCOPY; RANDOMNESS; X-RAY DIFFRACTION
Descriptors DEC
CHARGED PARTICLES; CHEMICAL COATING; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DEPOSITION; DIFFRACTION; EMISSION; EPITAXY; IONS; LASER SPECTROSCOPY; LUMINESCENCE; PHOTON EMISSION; SCATTERING; SPECTRA; SPECTROSCOPY; SURFACE COATING