Finite element evaluation of punch-type crack specimens
- 1. Fatigue and Fracture Laboratory, Mechanical Engineering Department, Iran University of Science and Technology, Narmak, Tehran 16844 (Iran, Islamic Republic of)
Description
The single punch shear (SPS) and double punch shear (DPS) specimens have been used in the past for determining Mode II fracture toughness of engineering materials. These two specimens are studied in this paper using a set of linear elastic finite element analysis. The near-crack-tip parameters consisting of stress intensity factors and T-stress are calculated in terms of the crack length ratio a/W for each specimen. It is shown that none of the specimens are subjected to pure Mode II since a considerable value of K I/K II is present for punch-type loading. The T-stress is also negative for both specimens. Using a generalized maximum tangential stress criterion, possible effects from ignoring the contributions of K I and T are investigated for test results obtained from these specimens when the failure is due to brittle fracture
Additional details
Identifiers
- DOI
- 10.1016/j.ijpvp.2005.03.004;
- PII
- S0308-0161(05)00057-8;
Publishing Information
- Journal Title
- International Journal of Pressure Vessels and Piping
- Journal Volume
- 82
- Journal Issue
- 9
- Journal Page Range
- p. 722-728
- ISSN
- 0308-0161
- CODEN
- PRVPAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016449
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- BRITTLE-DUCTILE TRANSITIONS; BRITTLENESS; CRACKS; EVALUATION; FINITE ELEMENT METHOD; FRACTURE PROPERTIES; FRACTURES; MATERIALS; MECHANICAL PROPERTIES; PRESSURE VESSELS; SHEAR; STRESS ANALYSIS; STRESS INTENSITY FACTORS; STRESSES
- Descriptors DEC
- CALCULATION METHODS; CONTAINERS; FAILURES; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; NUMERICAL SOLUTION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.