Resonant electron tunneling in single quantum well heterostructure junction of electrodeposited metal semiconductor nanostructures using nuclear track filters
Description
We report on resonant electron tunneling through a Cu-Se heterostructure junction grown electrochemically in the submicron size pores (0.8 μm) of a nuclear track filter (Polycarbonate). The prominent feature of negative differential resistance (NDR) has been observed in the current-voltage (I-V) characteristic of the so-fabricated array of resonant tunneling diodes (RTDs) even at room temperature, along with a significant peak to valley current ratio (2.5) of the resonance. Tunneling structures of the nanofabricated RTDs around zero bias are also observed at room temperature. Our results show that the low cost and relatively easy electrodeposition method can be a very effective way to prepare resonant quantum tunneling devices, using the pores of nuclear track filters
Additional details
Identifiers
- PII
- S0168583X99000865;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 151
- Journal Issue
- 1-4
- Journal Page Range
- p. 84-88
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- China
- INIS RN
- 33059637
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER; ELECTRICAL PROPERTIES; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTRONS; FABRICATION; FILTERS; HETEROJUNCTIONS; PARTICLE TRACKS; POLYCARBONATES; RESONANCE; SELENIUM; TUNNEL DIODES; TUNNEL EFFECT
- Descriptors DEC
- CARBON COMPOUNDS; CARBONATES; CHEMISTRY; DEPOSITION; ELECTROLYSIS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; LYSIS; METALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYMERS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.