Published April 2020 | Version v1
Book

Determination of the purity of silicon carbide by infrared absorption

  • 1. China North Nuclear Fuel Co., Ltd, Baotou (China)

Description

Study the silicon carbide content in silicon carbide powder by high frequency infrared carbon sulfur analyzer. The parameters, such as pretreatment conditions of the sample, sampling, accelerator, blank value, comparative level, precision are determined through a series of test conditions, then the method for the detection of silicon carbide content in silicon carbide samples is established. When the sample is 0.03 g, placed at 750 ℃ in a muffle furnace for 2 h, then cooling the temperature, addition of 1.5 g tungsten, 0.5 g iron, 0.3 g tin, analysis power is 70%, analysis time is 50 s, comparative level is 2.00%, the precision is better than 10%. Using calcium carbonate standard substance for recycling, the recovery is 85% ∼ 120%. (authors)

Part of:
Progress report on nuclear science and technology in China (Vol.6). Proceedings of academic annual meeting of China Nuclear Society in 2019, No.7--Nuclear Measurement and Analysis sub-volume

Additional details

Publishing Information

Publisher
China Atomic Energy Press
Imprint Place
Beijing (China)
ISBN
978-7-5221-0522-2
Imprint Title
Progress report on nuclear science and technology in China (Vol.6). Proceedings of academic annual meeting of China Nuclear Society in 2019, No.7--Nuclear Measurement and Analysis sub-volume
Imprint Pagination
17 p.
Journal Page Range
p. 12-17

Conference

Title
2019 academic annual meeting of China Nuclear Society
Dates
20-23 Aug 2019
Place
Baotou (China)

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
53115204
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ACCURACY; CARBON; DETECTION; IMPURITIES; INFRARED SPECTROMETERS; MEASURING METHODS; SAMPLING; SILICON CARBIDES
Descriptors DEC
CARBIDES; CARBON COMPOUNDS; ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; SILICON COMPOUNDS; SORPTION; SPECTROMETERS

Optional Information

Notes
1 fig., 6 tabs., 6 refs.