Application of synchrotron radiation to x-ray fluorescence analysis of trace elements

The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented