Published November 1990
| Version v1
Journal article
Excess noise of the silicon surface barrier detectors
Creators
- 1. Vysoka Skola Technicka, Kosice (Czechoslovakia)
- 2. Vysoke Uceni Technicke, Brno (Czechoslovakia)
- 3. Ceskoslovenska Akademie Ved, Prague (Czechoslovakia). Ustav Organicke Chemie a Biochemie
Description
Letter to the editor. 5 figs., 6 refs
Additional details
Publishing Information
- Journal Title
- Czechoslovak Journal of Physics
- Journal Volume
- 40
- Journal Issue
- 11
- Series
- Czech. J. Phys.
- Journal Page Range
- 1289-1292
- ISSN
- 0011-4626
- CODEN
- CZYPA
INIS
- Country of Publication
- Czech Republic
- Country of Input or Organization
- Serbia and Montenegro
- INIS RN
- 22052270
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; NOISE; SI SEMICONDUCTOR DETECTORS; SPECTRAL DENSITY; SURFACE BARRIER DETECTORS
- Descriptors DEC
- ELECTRICAL PROPERTIES; FUNCTIONS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRAL FUNCTIONS