Published May 1, 2019 | Version v1
Journal article

Advantages of a buried-gate structure for graphene field-effect transistor

  • 1. Center for Emerging Electronic Devices and Systems, Gwangju Institute of Science and Technology (GIST), Gwangju 61005 (Korea, Republic of)
  • 2. School of Material Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005 (Korea, Republic of)
  • 3. mmh Labs Electrical Engineering, Computer Electrical Mathematical Science and Engineering Division, 4700 King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900 (Saudi Arabia)

Description

Graphene field effect transistors (GFETs) with top-gate and back-gate structures have been extensively used without much consideration for compatibility with graphene. A comparative study of the electrical characteristics of buried-gate GFETs and top-gate GFETs revealed that the performance of buried-gate GFETs is drastically enhanced by having a better gate controllability, achieving three times higher field effect mobility (∼3000 cm2 V−1 s−1) than top-gate GFETs with on/off ratio ∼10. Carrier scattering was also substantially improved by minimizing the fringing field effect, which is found to be the origin of high series resistance in top-gate GFETs. Moreover, we showed by electromagnetic (EM) simulation that the electric field distribution inside the transistors is more uniform at the buried-gate GFETs than the top-gate GFETs. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6641/ab0d54

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
34
Journal Issue
5
Journal Page Range
[9 p.]
ISSN
0268-1242
CODEN
SSTEET

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52034769
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
CHARGE CARRIERS; COMPATIBILITY; COMPUTERIZED SIMULATION; ELECTRIC FIELDS; FIELD EFFECT TRANSISTORS; GRAPHENE; MOBILITY; PERFORMANCE; SCATTERING
Descriptors DEC
CARBON; ELEMENTS; NONMETALS; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS