Advantages of a buried-gate structure for graphene field-effect transistor
Creators
- 1. Center for Emerging Electronic Devices and Systems, Gwangju Institute of Science and Technology (GIST), Gwangju 61005 (Korea, Republic of)
- 2. School of Material Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005 (Korea, Republic of)
- 3. mmh Labs Electrical Engineering, Computer Electrical Mathematical Science and Engineering Division, 4700 King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900 (Saudi Arabia)
Description
Graphene field effect transistors (GFETs) with top-gate and back-gate structures have been extensively used without much consideration for compatibility with graphene. A comparative study of the electrical characteristics of buried-gate GFETs and top-gate GFETs revealed that the performance of buried-gate GFETs is drastically enhanced by having a better gate controllability, achieving three times higher field effect mobility (∼3000 cm2 V−1 s−1) than top-gate GFETs with on/off ratio ∼10. Carrier scattering was also substantially improved by minimizing the fringing field effect, which is found to be the origin of high series resistance in top-gate GFETs. Moreover, we showed by electromagnetic (EM) simulation that the electric field distribution inside the transistors is more uniform at the buried-gate GFETs than the top-gate GFETs. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6641/ab0d54Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 34
- Journal Issue
- 5
- Journal Page Range
- [9 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52034769
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CHARGE CARRIERS; COMPATIBILITY; COMPUTERIZED SIMULATION; ELECTRIC FIELDS; FIELD EFFECT TRANSISTORS; GRAPHENE; MOBILITY; PERFORMANCE; SCATTERING
- Descriptors DEC
- CARBON; ELEMENTS; NONMETALS; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS