Published February 28, 2005
| Version v1
Journal article
First steps in the growth of Cu thin films on the five-fold surface of the icosahedral Al-Cu-Fe quasicrystal
- 1. SORST, Japan Science and Technology Agency (Japan)
- 2. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
- 3. LSG2M, CNRS-UMR7584, Ecole des Mines, Parc de Saurupt, 54042 Nancy (France)
- 4. Department of Materials Science and Engineering, Ames Laboratory, Iowa 50011 (United States)
- 5. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, 980-8577 (Japan)
Description
The growth of Cu on the five-fold surface of the icosahedral Al-Cu-Fe is investigated by scanning tunneling microscopy. The clean surface exhibits atomically flat terraces separated by steps of different heights. The steps are found to be frequently bunched. For a coverage close to a monolayer, Cu forms a nearly closed film of a height corresponding to a monolayer of Cu. The film, however, does not exhibit long-range order
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2004.09.042;
- PII
- S0169-4332(04)01404-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 241
- Journal Issue
- 1-2
- Journal Page Range
- p. 256-260
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 9. international symposium on advanced physical fields
- Acronym
- APF-9
- Dates
- 1-4 Mar 2004
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38060551
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; COPPER ALLOYS; EPITAXY; IRON ALLOYS; SCANNING TUNNELING MICROSCOPY; SURFACES; THIN FILMS
- Descriptors DEC
- ALLOYS; CRYSTAL GROWTH METHODS; FILMS; MICROSCOPY; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.