Published December 20, 2003
| Version v1
Journal article
Low temperature route to grow polycrystalline cadmium selenide and mercury selenide thin films
Description
A simple, low temperature method has been developed to synthesize cubic CdSe and HgSe semiconductor thin films, based on chemical reaction of complexed CdSO4, Hg(NO3)2 with sodiumselenosulphate (Na2SeSO3) in aqueous alkaline medium at 278 K temperature. The films were characterized by using techniques of XRD, optical absorption, electrical measurements and AAS. The grown films were found to be uniform, well adherent, dark red, diffusely reflecting, polycrystalline in cubic form without trace of any hexagonallity. The CdSe film shows a double band gap at 2.15 and 1.86 eV, while the same for HgSe film occurs at 0.45 and 0.8 eV. Thermoelectric power measurements further indicated that the conduction takes place by n-type mechanism
Additional details
Identifiers
- DOI
- 10.1016/S0254-0584(03)00365-1;
- arXiv
- arXiv:hep-th/9702111v1;
- PII
- S0254058403003651;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 82
- Journal Issue
- 3
- Journal Page Range
- p. 711-717
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38075695
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CADMIUM SELENIDES; CADMIUM SULFATES; ELECTRICAL PROPERTIES; EV RANGE 01-10; MERCURY NITRATES; MERCURY SELENIDES; MILLI EV RANGE; OPTICAL PROPERTIES; POLYCRYSTALS; SEMICONDUCTOR MATERIALS; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ENERGY RANGE; EV RANGE; FILMS; MATERIALS; MERCURY COMPOUNDS; NITRATES; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SPECTROSCOPY; SULFATES; SULFUR COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.