Published October 2009 | Version v1
Journal article Metadata-only

Polarization Dependence of Linewidth Enhancement Factor in Semiconductor Optical Amplifier and Its Implication for Nonlinear Polarization Rotation

Creators

  • 1. Key Laboratory of Luminescence and Optical Information (Ministry of Education), Institute of Optical Information, School of Science, Beijing Jiaotong University, Beijing 100044 (China)

Description

Linewidth enhancement factors (LEFs) of the transverse electric mode and the transverse magnetic mode in bulk semiconductor optical amplifiers are measured using the nonlinear optical loop mirror method and the principal state of polarization vector method. The polarization dependence of LEFs plays an important role in the nonlinear polarization rotation. The relationship between the polarization-dependence of LEFs and nonlinear polarization rotation in the Stokes space is demonstrated

Availability note (English)

Available from http://dx.doi.org/10.1088/0256-307X/26/10/104205

Additional details

Identifiers

DOI
10.1088/0256-307X/26/10/104205;

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
26
Journal Issue
10
Journal Page Range
[4 p.]
ISSN
0256-307X
CODEN
CPLEEU

INIS

Country of Publication
China
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44123139
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AMPLIFIERS; LINE WIDTHS; MIRRORS; NONLINEAR PROBLEMS; POLARIZATION; ROTATION; SEMICONDUCTOR MATERIALS
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MOTION