High-purity silicon radiation-sensor array
Creators
- 1. Technische Hogeschool Delft (Netherlands). Dept. of Electrical Engineering
- 2. Technische Hogeschool Delft (Netherlands). Dept. of Applied Physics
Description
A radiation-sensor array designed and fabricated on high-purity silicon (substrate resistivity 4 KΩ cm ±35%) with separate x- and y-readout addresses is presented. The operation of the device is based on both the resistive and the capacitive coupling of the elements in a matrix of sensing diodes. A 3x3 matrix of 0.25 mm2 elements has been integrated as a prototype. The columnar elements are resistively coupled to one output connection through the use of highly-doped polysilicon structures, while utilization of the double-layer metalization technique provides capacitive coupling of those elements lying in the same row to a separate output connection. Although the processing requirements included integrated-circuit fabrication techniques not commonly employed in the processing of silicon-radiation sensors, the array demonstrated good characteristics. Experimental results confirmed two-dimensional position detection with minimal crosstalk. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A
- Journal Volume
- 275
- Journal Issue
- 3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 517-526
- ISSN
- 0168-9002
- CODEN
- NIMAE
Conference
- Title
- International workshop on silicon pixel detectors for particles and X-rays.
- Dates
- 31 May - 2 Jun 1988.
- Place
- Louvain (Belgium).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 20035030
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND NOISE; BETA DETECTION; CAPACITANCE; CHARGE-COUPLED DEVICES; DOPED MATERIALS; EQUIVALENT CIRCUITS; FABRICATION; INTEGRATED CIRCUITS; POSITION SENSITIVE DETECTORS; PULSE RISE TIME; RADIATION MONITORS; RESPONSE FUNCTIONS; SI SEMICONDUCTOR DETECTORS; SILICON
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ELEMENTS; FUNCTIONS; MATERIALS; MEASURING INSTRUMENTS; MONITORS; NOISE; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMIMETALS; TIMING PROPERTIES