Published December 2014 | Version v1
Journal article

Construction and calibration of a multipurpose instrument to simultaneously measure dose, voltage and half-value layer in X-ray emission equipment

Description

This work reports on the development of a multipurpose instrument that simultaneously measures delivered dose (air kerma), peak voltage (kVp) and half value layer (HVL) in X-ray machines. The device will help control quality of X-ray equipment routinely used in diagnostic and interventional radiological procedures. The measuring device is equipped with several attenuating filters of different materials and thicknesses, and Gafchromic® XR-QA2 radiochromic films are used as sensitive elements. The films are scanned after being irradiated and the resulting color intensities indicate a relationship between the degree of film darkening under each individual filter and the quantities of interest, i.e. air kerma, kVp and HVL. Comparing HVL values measured using the proposed multipurpose instrument with those of a reference standard ionization chamber, discrepancy reached 8.4%. As for the kVp evaluation, anomalous results were observed for low atomic number materials and small thicknesses, especially for peak voltages higher than 70 kVp. However, for materials with higher Z and reasonable thickness, the calibration curve R × kVp was quite satisfactory, being R the ratio between the color intensities obtained with two distinct filters. We have also observed a decrease in the influence of Tungsten characteristic radiation on the calibration curve. These results suggest that the proposed instrument may be satisfactorily used to routinely control quality of X-ray equipment, estimating the radiation dose resulting from the direct beam, the applied voltage across the electrodes and the half value layer. - Highlights: • Construction and calibration of a novel instrument to measure dose, kVp and HVL. • Materials displaying appropriate characteristics improve kVp estimates. • The multipurpose instrument may help quality control of X-ray equipment

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2014.05.029

Additional details

Identifiers

DOI
10.1016/j.radmeas.2014.05.029;
PII
S1350-4487(14)00178-4;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
71
Journal Page Range
p. 178-182
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
17. solid state dosimetry conference
Acronym
SSD17
Dates
22-27 Sep 2013
Place
Recife (Brazil)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46127932
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC NUMBER; CALIBRATION; ELECTRIC POTENTIAL; FILM DOSIMETRY; IONIZATION CHAMBERS; IRRADIATION; KERMA; QUALITY CONTROL; RADIATION DOSES; RADIATION QUALITY; TUNGSTEN; X RADIATION; X-RAY EQUIPMENT
Descriptors DEC
CONTROL; DOSES; DOSIMETRY; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.