Characterizing oxygen atoms in perovskite and pyrochlore oxides using ADF-STEM at a resolution of a few tens of picometers
Creators
- 1. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)
- 2. Department of Chemical and Biological Engineering, University of Sheffield, Sheffield S1 3JD (United Kingdom)
- 3. Department of Materials Science and Engineering, University of Sheffield, Sheffield S1 3JD (United Kingdom)
- 4. Department of Physics, University of Warwick, Gibbet Hill Road, Coventry CV4 7AL (United Kingdom)
Description
We present an aberration corrected scanning transmission electron microscopy (ac-STEM) analysis of perovskite (LaFeO3) and pyrochlore (Yb2Ti2O7 and Pr2Zr2O7) oxides and demonstrate that both the shape and contrast of visible atomic columns in annular dark-field (ADF) images are sensitive to the presence of nearby atoms of low atomic number (e.g. oxygen). We show that point defects (e.g. oxygen vacancies), which are invisible – or difficult to observe due to limited sensitivity – in x-ray and neutron diffraction measurements, are the origin of the complex magnetic ground state of pyrochlore oxides. In addition, we present a method by which light atoms can be resolved in the quantitative ADF-STEM images. Using this method, we resolved oxygen atoms in perovskite and pyrochlore oxides and propose this method to be suitable for other materials containing both light and heavy elements.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2021.116717Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2021.116717;
- PII
- S1359645421000975;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 208
- Journal Page Range
- vp.
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54013438
- Subject category
- S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ATOMIC NUMBER; ATOMS; GROUND STATES; MATERIALS; NEUTRON DIFFRACTION; OXIDES; OXYGEN; PEROVSKITE; PYROCHLORE; RESOLUTION; SENSITIVITY; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY LEVELS; MICROSCOPY; MINERALS; NONMETALS; OXIDE MINERALS; OXYGEN COMPOUNDS; PEROVSKITES; POINT DEFECTS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2021 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.