Published 1974
| Version v1
Report
Restricted
A precise X-ray diffraction study of elastically deformed silicon monocrystals
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.
Files
Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Additional titles
- Subtitle (English)
- Abstract
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- AED-Conf--74-205-002
Conference
- Title
- Internal discussion meeting on studies of lattice distortions and local atomic arrangements by X-ray, neutron and electron diffraction.
- Dates
- 29 Apr 1974.
- Place
- Juelich, F.R. Germany.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 5144479
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- DEFORMATION; GONIOMETERS; MONOCRYSTALS; PLASTICITY; SILICON; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 2 refs. Short communication only.