Measurements of femtosecond pulse temporal profile by means of a Michelson interferometer with a Schottky junction
Description
We introduce a new method for femtosecond pulse shape measurement. The interference of two pulses is employed rather than the second-harmonic generation (SHG). Usually, the measurements of the femtosecond pulse is realized by an interferometer in combination with a nonlinear optical material, while the measurement that we describe is realized by means of a Michelson interferometer with a Schottky junction. Only a metal-semiconductor junction(Schottky junction) is needed, and neither the nonlinear optical material nor a photodetector is included. The two-photon absorption arises when the light is strong enough, while there is only a one-photon absorption when the light is weak. And the calculations are in good agreement with the experimental results. In principle, the new technique could be used for the measuring of pulses with any duration and with very low power. Unlike the SHG scheme, in the new method the quality of optics, mechanics, and other elements of the scheme are not essential, and the measurement is easily realized, but the results are quite precise and very sensitive to the light
Additional details
Identifiers
- DOI
- 10.1364/AO.45.009087;
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 45
- Journal Issue
- 36
- Journal Page Range
- p. 9087-9091
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38026991
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; COLLIMATORS; HARMONIC GENERATION; INTERFERENCE; MICHELSON INTERFEROMETER; NONLINEAR PROBLEMS; OPTICS; OXYGEN COMPOUNDS; PHOTONS; PULSE SHAPERS; SEMICONDUCTOR JUNCTIONS; SILICON COMPOUNDS; VISIBLE RADIATION
- Descriptors DEC
- BOSONS; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FREQUENCY MIXING; INTERFEROMETERS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; PULSE CIRCUITS; RADIATIONS; SIGNAL CONDITIONERS; SORPTION
Optional Information
- Notes
- (c) 2006 Optical Society of America