Published June 6, 2008
| Version v1
Journal article
Exponentially Enhanced Quantum Metrology
Creators
- 1. School of Physical Sciences, Jawaharlal Nehru University, New Delhi 110067 (India)
- 2. Computer Science, University of York, York YO 10 5DD (United Kingdom)
Description
We show that when a suitable entanglement-generating unitary operator depending on a parameter is applied on N qubits in parallel, a precision of the order of 2-N in estimating the parameter may be achieved. This exponentially improves the precision achievable in classical and in quantum nonentangling strategies
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 100
- Journal Issue
- 22
- Journal Page Range
- p. 220501-220501.4
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40013600
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ACCURACY; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS; QUBITS
- Descriptors DEC
- INFORMATION; MECHANICS; QUANTUM INFORMATION
Optional Information
- Notes
- (c) 2008 The American Physical Society