Published February 1, 1987 | Version v1
Journal article Metadata-only

Critical fields of Nb-Ta multilayers

Creators

  • 1. Department of Applied Physics, Stanford University, Stanford, California 94305

Description

Nb-Ta multilayered films prepared by magnetron sputtering have been studied by critical-field measurements. We have examined the effects of substrate orientation and deposition temperature on the properties of the films. Three-dimensional to two-dimensional crossover is observed. For films with larger Nb layer thicknesses an additional transition in H/sub c/2/sub X/ at lower temperatures is observed which cannot be accounted for by the interfacial regions

Additional details

Publishing Information

Journal Title
Phys. Rev., B: Condens. Matter
Journal Volume
35
Journal Issue
4
Series
Phys. Rev., B: Condens. Matter.
Journal Page Range
1664-1668
ISSN
0163-1829
CODEN
PRBMD

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18055432
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
COHERENCE LENGTH; CRITICAL FIELD; ELECTRIC CONDUCTIVITY; EPITAXY; EXPERIMENTAL DATA; GINZBURG-LANDAU THEORY; LAYERS; MAGNETRONS; NIOBIUM; SAPPHIRE; SPUTTERING; SUBSTRATES; SUPERLATTICES; TANTALUM; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CORUNDUM; DATA; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; INFORMATION; MAGNETIC FIELDS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; NUMERICAL DATA; OXIDE MINERALS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENTS