The modification of silicon surface by selected aminophosphonates to improve Its tribological properties
- 1. University of Lodz, Faculty of Chemistry, Department of Materials Technology and Chemistry, Pomorska 163, 90-236 Lodz (Poland)
- 2. University of Lodz, Faculty of Chemistry, Department of Organic Chemistry, Tamka 12, 91-403 Lodz (Poland)
Description
In biomedical applications, the use of materials such as silicon has certain limitations resulting from the formation of a partially oxidized layer on top of the surface, causing corrosion and wear. Therefore, there is a need to modify the surface with non-toxic compounds that are tolerated in the human body. In this study, the thin films of aminophosphonate have been successfully formed on the silicon surface. The resulting monolayers were characterized by Fourier transform infrared spectroscopy (FTIR), atomic force microscopy (AFM) and contact angle goniometry. Additionally, the tribological behavior was examined for their potential use. It was demonstrated that the adhesion force, the work of adhesion and the wear influence the value of the friction coefficient in microscale. Moreover, the experimental data showed that the modification of silicon substrate via aminophosphonates caused a crucial decrease in the coefficient of friction value about 50%, the adhesive force about 85% and wear about 80%. The presented results prove the potential of aminophosphonates films in biomedical and frictional applications from the point of view of their excellent tribological properties. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab6545Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 6
- Journal Issue
- 12
- Journal Page Range
- [13 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52014490
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADHESION; ADHESIVES; ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM SPECTROMETERS; FRICTION FACTOR; INFRARED SPECTRA; MODIFICATIONS; SILICON; THIN FILMS; WEAR
- Descriptors DEC
- DIMENSIONLESS NUMBERS; ELEMENTS; FILMS; MEASURING INSTRUMENTS; MICROSCOPY; SEMIMETALS; SPECTRA; SPECTROMETERS