Published July 1, 2009 | Version v1
Journal article

Submolecular features of epitaxially grown PTCDA on Cu(111) analyzed by force field spectroscopy

  • 1. Physikalisches Institut, Universitaet Muenster, Wilhelm-Klemm-Strasse 10, 48149 Muenster (Germany)
  • 2. Marian Smoluchowski Institute of Physics, Jagiellonian University Krakow (Poland)

Description

Submolecular features of epitaxially grown 3,4,9,10-perylenetetra-carboxylic-dianhydride (PTCDA) on Cu(111) are resolved in non-contact atomic force microscopy topography scans in ultrahigh vacuum. While molecules in the first layer above the Cu substrate are depicted as featureless ovals, the second layer molecules show an intramolecular structure with a height corrugation of up to 40 pm. Force field spectroscopy experiments with submolecular resolution show that the tip-molecule forces differ significantly on the first and second layer molecules. Possible contributions to these force differences from mechanical deformations of the molecules as well as the internal charge density distribution are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/20/26/264004

Additional details

Identifiers

DOI
10.1088/0957-4484/20/26/264004;
PII
S0957-4484(09)09837-7;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
20
Journal Issue
26
Journal Page Range
[6 p.]
ISSN
0957-4484

Conference

Title
11. international conference on non-contact atomic force microscopy
Acronym
NCAFM2008
Dates
15-19 Sep 2008
Place
Madrid (Spain)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41017241
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHARGE DENSITY; EPITAXY; LAYERS; MOLECULES; NANOSTRUCTURES; SPECTROSCOPY; TOPOGRAPHY
Descriptors DEC
CRYSTAL GROWTH METHODS; MICROSCOPY