Published July 1, 2009
| Version v1
Journal article
Submolecular features of epitaxially grown PTCDA on Cu(111) analyzed by force field spectroscopy
- 1. Physikalisches Institut, Universitaet Muenster, Wilhelm-Klemm-Strasse 10, 48149 Muenster (Germany)
- 2. Marian Smoluchowski Institute of Physics, Jagiellonian University Krakow (Poland)
Description
Submolecular features of epitaxially grown 3,4,9,10-perylenetetra-carboxylic-dianhydride (PTCDA) on Cu(111) are resolved in non-contact atomic force microscopy topography scans in ultrahigh vacuum. While molecules in the first layer above the Cu substrate are depicted as featureless ovals, the second layer molecules show an intramolecular structure with a height corrugation of up to 40 pm. Force field spectroscopy experiments with submolecular resolution show that the tip-molecule forces differ significantly on the first and second layer molecules. Possible contributions to these force differences from mechanical deformations of the molecules as well as the internal charge density distribution are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/26/264004Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/26/264004;
- PII
- S0957-4484(09)09837-7;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 26
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
Conference
- Title
- 11. international conference on non-contact atomic force microscopy
- Acronym
- NCAFM2008
- Dates
- 15-19 Sep 2008
- Place
- Madrid (Spain)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41017241
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHARGE DENSITY; EPITAXY; LAYERS; MOLECULES; NANOSTRUCTURES; SPECTROSCOPY; TOPOGRAPHY
- Descriptors DEC
- CRYSTAL GROWTH METHODS; MICROSCOPY