Published November 2008 | Version v1
Journal article

Damping constant of Co/Pt multilayer thin-film media

  • 1. Yamagata University, 4-3-16 Jonan, Yonezawa, Yamagata 992-8510 (Japan)
  • 2. National University of Fine Arts and Music, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8577 (Japan)

Description

Gilbert's damping constants, α, of Co(tCo)/Pt (1.4 nm) multilayer thin films are investigated by Q-band FMR analysis. α is calculated from the resonance width of the FMR spectrum. With decreasing tCo, the α value decreases from 0.034 (tCo=8.7 nm) to 0.023 (tCo=1.8 nm), and then increases to 0.037 (tCo=1.0 nm). The decrease of α with tCo>1.8 nm is probably due to the eddy current loss effects. The increase of α with tCo<1.8 nm would be caused by the increase of the distortion between the Co and the Pt layers at the interface. When the magnetic field direction was changed from θ=90 deg. (parallel to the specimen) to θ=0 deg. (perpendicular to the specimen), the α of all the specimens increased, and a sharp step in α was observed around θ=40 deg., where the α has the maximum value

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2008.08.012

Additional details

Identifiers

DOI
10.1016/j.jmmm.2008.08.012;
PII
S0304-8853(08)00853-6;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
320
Journal Issue
22
Journal Page Range
p. 3019-3022
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
8. perpendicular magnetic recording conference
Dates
15-17 Oct 2007
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40056001
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COBALT; DAMPING; EDDY CURRENTS; FERROMAGNETIC RESONANCE; INTERFACES; LAYERS; MAGNETIC FIELDS; PLATINUM; SPECTRA; THIN FILMS
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELEMENTS; FILMS; MAGNETIC RESONANCE; METALS; PLATINUM METALS; RESONANCE; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.