Published June 15, 2019 | Version v1
Journal article

Microstucture, dielectric properties and impedance analysis of NaBixTi6O12.5+1.5x lead-free ceramics

  • 1. School of Physics and Electronic Science, Hubei University, Key Laboratory of Ferro & Piezoelectric Materials and Devices of Hubei Province (China)

Description

Lead-free NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) with a pseudo-perovskite structure were prepared via the traditional solid-phase reaction. The structure, dielectric properties and impedance spectroscopy of the NaBixTi6O12.5+1.5x ceramics were investigated in detail. X-ray diffraction patterns reveal that all of the prepared ceramics have a single phase and the scanning electron microscope confirms the well-growth performance of the ceramics. The dielectric constant and dielectric loss show great stability with a wide temperature range. It can be learned that the resistance, the maximum Debye peak, and the corresponding capacitance simultaneously decrease with increasing temperature by analysing Z* plots. The active energy of the NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) are respectively 0.67, 0.56, 1.34 and 1.37 eV, meanwhile, there is no phase transition point in 25–750 °C. The results demonstrate that the electrical properties of the NaBixTi6O12.5+1.5x lead-free ceramics can be well tuned by varying the Bi quantity.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
30
Journal Issue
11
Journal Page Range
p. 10821-10829
ISSN
0957-4522
CODEN
JSMEEV

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52018980
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; PHASE TRANSFORMATIONS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING

Optional Information

Copyright
Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature