Microstucture, dielectric properties and impedance analysis of NaBixTi6O12.5+1.5x lead-free ceramics
- 1. School of Physics and Electronic Science, Hubei University, Key Laboratory of Ferro & Piezoelectric Materials and Devices of Hubei Province (China)
Description
Lead-free NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) with a pseudo-perovskite structure were prepared via the traditional solid-phase reaction. The structure, dielectric properties and impedance spectroscopy of the NaBixTi6O12.5+1.5x ceramics were investigated in detail. X-ray diffraction patterns reveal that all of the prepared ceramics have a single phase and the scanning electron microscope confirms the well-growth performance of the ceramics. The dielectric constant and dielectric loss show great stability with a wide temperature range. It can be learned that the resistance, the maximum Debye peak, and the corresponding capacitance simultaneously decrease with increasing temperature by analysing Z* plots. The active energy of the NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) are respectively 0.67, 0.56, 1.34 and 1.37 eV, meanwhile, there is no phase transition point in 25–750 °C. The results demonstrate that the electrical properties of the NaBixTi6O12.5+1.5x lead-free ceramics can be well tuned by varying the Bi quantity.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 11
- Journal Page Range
- p. 10821-10829
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52018980
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; PHASE TRANSFORMATIONS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature