Formation of interstitial silicon defects in Si- and Si,P-doped nanodiamonds and thermal susceptibilities of SiV− photoluminescence band
Creators
- 1. School of Mathematics and Physics, The University of Queensland, QLD 4072 (Australia)
- 2. GREMAN, UMR CNRS-7347, University F. Rabelais, F-37200 Tours (France)
- 3. L.F. Vereshchagin Institute for High Pressure Physics, The Russian Academy of Sciences, Troitsk, Moscow 108840 (Russian Federation)
Description
We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV−) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in biological systems. Comparison of the relative brightness of the Si- and Si,P-doped crystals shows that phosphorous significantly increases average concentration and homogeneity of distribution of SiV− centers in nanodiamonds. Moreover, linear dependence on temperature of the zero-phonon line width in Si-doped crystals is 0.061(2) nm K−1 but is 0.047(3) nm K−1, about 35% smaller in Si,P-doped nanodiamonds. This proves control of SiV− properties with additional chemical doping and close proximity of Si and P atoms. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/ab72bbAdditional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 31
- Journal Issue
- 20
- Journal Page Range
- [7 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53031115
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CONCENTRATION RATIO; CRYSTALS; DOPED MATERIALS; INTERSTITIALS; PHONONS; PHOTOLUMINESCENCE; SILICON; TEMPERATURE RANGE
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONLESS NUMBERS; ELEMENTS; EMISSION; EVALUATION; LUMINESCENCE; MATERIALS; PHOTON EMISSION; POINT DEFECTS; QUASI PARTICLES; SEMIMETALS