Published May 15, 2020 | Version v1
Journal article

Formation of interstitial silicon defects in Si- and Si,P-doped nanodiamonds and thermal susceptibilities of SiV photoluminescence band

  • 1. School of Mathematics and Physics, The University of Queensland, QLD 4072 (Australia)
  • 2. GREMAN, UMR CNRS-7347, University F. Rabelais, F-37200 Tours (France)
  • 3. L.F. Vereshchagin Institute for High Pressure Physics, The Russian Academy of Sciences, Troitsk, Moscow 108840 (Russian Federation)

Description

We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in biological systems. Comparison of the relative brightness of the Si- and Si,P-doped crystals shows that phosphorous significantly increases average concentration and homogeneity of distribution of SiV centers in nanodiamonds. Moreover, linear dependence on temperature of the zero-phonon line width in Si-doped crystals is 0.061(2) nm K−1 but is 0.047(3) nm K−1, about 35% smaller in Si,P-doped nanodiamonds. This proves control of SiV properties with additional chemical doping and close proximity of Si and P atoms. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6528/ab72bb

Additional details

Identifiers

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
31
Journal Issue
20
Journal Page Range
[7 p.]
ISSN
0957-4484

INIS