Secondary ion mass spectrometric signal enhancement of phosphatidylcholine dioleoyl on enlarged nanoparticles surface
- 1. N.N. Semenov Institute of Chemical Physics, RAS, Kosigin str. 4, Moscow 119991 (Russian Federation)
- 2. Moscow Institute of Physics and Technology, Institutskii per. 9, Dolgoprudny, Moscow 141700 (Russian Federation)
- 3. Institute of Problem of Chemical Physics, RAS, Semenov av. 1, Chernogolovka, 142432 (Russian Federation)
Description
Graphical abstract: - Highlights: • TOF-SIMS mass-spectra of DOPC lipid on enlarged nanoparticles surface were studied. • Metallic, semiconductor, dielectric and hybrid nanoparticles were examined. • Effect of nanoparticles on mass-spectral peaks intensity was investigated. • The highest signal enhancement of 42 times was found for hybrid core–shell Au/SiO2 nanoparticles. - Abstract: A silicon wafer surface coverage of nanoparticles (NPs) can enhance the L-α-phosphatidylcholine dioleoyl (DOPC) signal intensity in time-of-flight secondary ion mass spectrometry (TOF-SIMS). A ToF-SIMS mass spectrometer was used with a pulsed primary beam of focused 30 keV Bi3+ ions. The signal enhancing effect has been studied for metallic (Ag, Au, Pb), semiconductor (TiO2), dielectric (SiO2) and hybrid (Au/TiO2NPs, core–shell Au/SiO2) nanoparticles. Ag NPs can attenuate secondary ions signal, whereas all other studied NPs show the signal enhancement. The emission of DOPC lipid secondary ions immobilized on core–shell Au/SiO2NPs was enhanced up to 42 times. This technique is a simple preparatory method enabling an overall increase in molecular lipid ions
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.07.102Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.07.102;
- PII
- S0169-4332(14)01630-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 316
- Journal Page Range
- p. 36-41
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46112596
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIELECTRIC MATERIALS; GOLD; ION MICROPROBE ANALYSIS; IONS; KEV RANGE 10-100; LEAD; LECITHINS; MASS SPECTRA; MASS SPECTROMETERS; MASS SPECTROSCOPY; NANOPARTICLES; SEMICONDUCTOR MATERIALS; SIGNALS; SILICA; SILICON; SILICON OXIDES; SILVER; SURFACES; TIME-OF-FLIGHT METHOD; TITANIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTS; ENERGY RANGE; ESTERS; KEV RANGE; LIPIDS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROANALYSIS; MINERALS; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; ORGANIC PHOSPHORUS COMPOUNDS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PARTICLES; PHOSPHOLIPIDS; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.