Thickness-dependent atomic structures of two-dimensional few-layer ZnO: A density functional theory study
Creators
- 1. State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, People's Republic of China
- 2. State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, People's Republic of China
- 3. School of Materials Science and Engineering, Beijing Institute of Technology, Beijing 100081, People's Republic of China
- 4. School of Physics and Electronics, Hunan University, Changsha 410082, People's Republic of China
- 5. CAS Key Laboratory of Magnetic Materials, Devices and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, People's Republic of China
Description
The thickness-dependent atomic structures of two-dimensional (2D) few-layer (FL) ZnO are systematically investigated by the first-principles calculations. It is found that the structural transformation between thinner FL ZnO with graphitic structure and thicker FL ZnO with wurtzite structure takes place at the critical thickness of 9–12 Zn-O atomic layers. At the thickness of 9–12 layers, both graphitic and wurtzite structures can coexist at room temperature. In FL , the interlayer interaction is a long-range Coulomb interaction, and the charge population of Zn and O inside does not change during the structural transformation. Moreover, we demonstrate that the structural transformation of FL ZnO originates from the competition between the high energy of the O orbital in the graphitic structure and the polar-surface-induced dipole energy in the wurtzite structure. Our microscopic understanding guides a clear direction of regulating the atomic structure of FL ZnO, further optimizing its electronic properties, which benefits developing function-advanced 2D stacked devices.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevB.109.014105;
- Crossref Funder ID
- 10.13039/501100001809; 10.13039/501100011789;
Publishing Information
- Journal Title
- Physical Review B
- Journal Volume
- 109
- Journal Issue
- 1
- Journal Page Range
- 6 pgs.
- ISSN
- 1550-235X
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COULOMB FIELD; DENSITY FUNCTIONAL METHOD; DIPOLE MOMENTS; DIPOLES; EQUIPMENT; GRAPHITE; INTERACTIONS; LAYERS; OPTIMIZATION; SURFACES; THICKNESS; ZINC; ZINC OXIDES
- Descriptors DEC
- CALCULATION METHODS; CARBON; CHALCOGENIDES; DIMENSIONS; ELECTRIC FIELDS; ELEMENTS; METALS; MINERALS; MULTIPOLES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; VARIATIONAL METHODS; ZINC COMPOUNDS
Optional Information
- Copyright
- ©2024 American Physical Society
- Contract/Grant/Project number
- 11974344; 12274180; 12274172; 11704111; 20230101004JC
- Notes
- Contact Email: hand@ciomp.ac.cn; Contact Email: shendz@ciomp.ac.cn; Record automatically processed
- Funding organization
- National Natural Science Foundation of China; Department of Science and Technology of Jilin Province