Published May 15, 2005
| Version v1
Journal article
Synthesis and structural analysis of lithium nickel vanadate
- 1. Solid State and Radiation Physics Laboratory, Department of Physics, Bharathiar University, Coimbatore 641 046 (India)
- 2. Institute of Multidisciplinary Research for Advanced Materials Tohoku University, Sendai (Japan)
Description
The compound LixNiVO4 (x = 0.8; 1.0; 1.2) has been prepared by a solid state reaction method at 800 deg. C. The X-ray diffraction pattern of Li1.2NiVO4 shows the absence of the (1 1 1) line, indicating the occupation of more vanadium ions on the tetrahedrally coordinated interstices. The averaged size of the particles and the grain size have been found to be around 2-10 μm. The grain interior and grain boundary resistance values are found to be 4.08 x 105 and 1.45 x 106 Ω cm-1 at 573 K. The formal activation energy, describing the temperature dependence of conductivity of Li0.8NiVO4, was found to be 0.64 eV
Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2004.10.054;
- PII
- S0254-0584(04)00603-0;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 91
- Journal Issue
- 1
- Journal Page Range
- p. 94-98
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37054397
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; GRAIN BOUNDARIES; GRAIN SIZE; IMPEDANCE; LITHIUM COMPOUNDS; MILLI EV RANGE; NICKEL COMPOUNDS; PARTICLE SIZE; SPECTROSCOPY; SPINELS; SYNTHESIS; TEMPERATURE DEPENDENCE; VANADATES; VANADIUM IONS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ENERGY; ENERGY RANGE; IONS; MICROSTRUCTURE; MINERALS; OXIDE MINERALS; OXYGEN COMPOUNDS; SCATTERING; SIZE; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.