Published 2010
| Version v1
Miscellaneous
Determination of k-shell fluorescence parameters for medium-Z elements
Creators
- 1. Agri Ibrahim Cecen University, Agri (Turkey)
- 2. Atatuerk University, Erzurum (Turkey)
Description
K X-ray fluorescence parameters ( Kα1, Kα2,Kβ1', Kβ2', Kα and Kβ X-rays fluorescence cross sections and the average K shell fluorescence yields) for selected ten elements in the atomic range 42≤Z≤66 have been experimentally determined at photon excitation energy of 59.5 keV. K X-rays emitted from the samples have been counted by a Si(Li) detector. The Kα1, Kα2,Kβ1' and Kβ2' spectra for investigated elements have been derived from the measured K shell X-ray spectra by peak fitting process. Experimental results of K X-ray fluorescence parameters have been compared with theory. In general there is an agreement within the standard uncertainties of the experimental and theoretical values.
Additional details
Additional titles
- Original title (English)
- Oezetler Kitabi
Publishing Information
- Imprint Place
- Istanbul (Turkey)
- Imprint Title
- Book of Abstracts
- Imprint Pagination
- 710 p.
- Journal Page Range
- p. 326
- Report number
- INIS-TR--0153
Conference
- Title
- Turkish Physical Society 26. International Physics Congress
- Original Conference Title
- Turk Fizik Dernegi 26. Uluslararasi Fizik Kongresi
- Dates
- 24-27 Sep 2009
- Place
- Bodrum (Turkey)
INIS
- Country of Publication
- Turkey
- Country of Input or Organization
- Turkey
- INIS RN
- 42089025
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature, Numerical Data
- Descriptors DEI
- ATOMIC NUMBER; CROSS SECTIONS; ENERGY-LEVEL TRANSITIONS; EVALUATED DATA; EXCITATION; EXPERIMENTAL DATA; K SHELL; LI-DRIFTED SI DETECTORS; SPECTRA; THEORETICAL DATA; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; INFORMATION; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Imprint:Oezetler Kitabi