Structural and photocarrier radiometric characterization of Cux(CdTe)yOz thin films growth by reactive sputtering
Creators
- 1. Division de Investigacion y Posgrado, Facultad de Ingenieria, Universidad Autonoma de Queretaro, Cerro de las Campanas S/N, Queretaro, Qro., Mexico, C.P. 76010 (Mexico)
- 2. Universidad Tecnologica de Queretaro, Av. Pie de la Cuesta S/N, Sn. Pedrito Penuelas, Queretaro, Qro. Mexico (Mexico)
- 3. Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Apartado Postal 1-798, Queretaro, Qro., Mexico C.P.76001 (Mexico)
- 4. Departamento de Nanotecnologia, Centro de Fisica Aplicada y Tecnologia Avanzada, Universidad Nacional Autonoma de Mexico, Campus Juriqulla, Apartado Postal 1-1010, Queretaro, Qro. Mexico (Mexico)
Description
This research presents a structural and photocarrier radiometric (PCR) characterization of Cux(CdTe)yOz thin films grown using reactive radiofrequency co-sputtering. Electronic distribution induced by variations in dopant concentration as a function of the position was studied using photocarrier radiometric images. Optical and structural characterization of these thin films was carried out by using micro Raman spectroscopy and X-ray diffraction. Due to its nondestructive and noncontact characteristics, the PCR is an excellent technique that permits one to obtain details of lateral electronic distribution across the sample. It was found that Cu target power influences the electronic distribution and produces different phases such as Cu2Te and CdO.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2010.11.011Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2010.11.011;
- PII
- S0040-6090(10)01547-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 7
- Journal Page Range
- p. 2135-2140
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42072048
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM OXIDES; CADMIUM TELLURIDES; COPPER OXIDES; COPPER TELLURIDES; DISTRIBUTION; RADIOWAVE RADIATION; RAMAN SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTROMAGNETIC RADIATION; FILMS; LASER SPECTROSCOPY; MATERIALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.