Published July 1985 | Version v1
Journal article

Detection of 1.5 to 60 KeV X-ray with semiconductor detectors

Creators

  • 1. Beijing Nuclear Instrument Factory (China)

Description

This paper presents semiconductor detectors for X-ray energy measurements. The characteristics and applications of silicon and germanium detectors have been contrasted. The fabrication and properties of detectors for X-ray fluorescence analysis are briefed, also the factors which infuence the efficiency of semiconductor detectors are pointed. Using those detectors, 1.5 to 60 KeV X-ray or low energy γ-ray have been measured. For X-ray above 5 KeV, the measurement efficiency is calibrated with 241Am source and for that below 5 KeV the window attenuation measurements with glass fluorescence sources are described. Obtained results are compared with other corresponding published data

Additional details

Publishing Information

Journal Title
Nucl. Electron. Detect. Technol.
Journal Volume
5
Journal Issue
4
Series
Nucl. Electron. Detect. Technol.
Journal Page Range
222-227, 231
CODEN
HDYUE