Notched double-curvature shells with cracks under pulsating internal pressure
- 1. Department of Civil and Environmental Engineering and Architecture, University of Parma, Viale G.P. Usberti 181/A, 43100 Parma (Italy)
Description
In the present paper, a double-curvature thin-walled shell with a surface crack starting from the root of an external circular-arc notch under cyclic loading is examined. The stress-intensity factor (SIF) along the elliptical-arc crack front is computed through a three-dimensional finite element analysis, for several elementary polynomial stress distributions perpendicular to the crack faces. By using the power series expansion of the actual stress field and the superposition principle, an approximate expression of the SIF in the case of a generic complex loading can be determined. Then the effect of the notch stress concentration on the SIF (and on the fatigue) behaviour is analysed for both cylindrical and spherical shells under (pulsating) internal pressure.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ijpvp.2008.12.007Additional details
Identifiers
- DOI
- 10.1016/j.ijpvp.2008.12.007;
- PII
- S0308-0161(08)00193-2;
Publishing Information
- Journal Title
- International Journal of Pressure Vessels and Piping
- Journal Volume
- 86
- Journal Issue
- 7
- Journal Page Range
- p. 443-453
- ISSN
- 0308-0161
- CODEN
- PRVPAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41014590
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRACKS; CYLINDRICAL CONFIGURATION; FATIGUE; FINITE ELEMENT METHOD; NOTCHES; POLYNOMIALS; POWER SERIES; SHELLS; SPHERICAL CONFIGURATION; STRESS INTENSITY FACTORS; STRESSES; SURFACES; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CALCULATION METHODS; CONFIGURATION; FUNCTIONS; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; NUMERICAL SOLUTION; SERIES EXPANSION
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.