Published March 2010
| Version v1
Journal article
Marshmallowing of nanopillar arrays by field emission
Creators
- 1. Electrical and Computer Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison, Wisconsin 53706 (United States)
Description
We fabricated nanoscale field electron emitters formed by highly-doped silicon nanopillars on a silicon membrane. Electron-beam induced deposition of carbon-based contaminants is employed as a probe of the spatial activity of electron emission from the nanopillars. In stark contrast to the general assumption that field emission only occurs at the tips of nanoscale emitters, we found strong emission from the sidewalls of the nanopillars. This is revealed by the deposition of carbon contaminants on these sidewalls, so that the nanopillars finally resemble marshmallows. We conclude that field emission from nanostructured surfaces is more intricate than previously expected.
Additional details
Identifiers
- DOI
- 10.1063/1.3309776;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 107
- Journal Issue
- 5
- Journal Page Range
- p. 054308-054308.4
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42069833
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARBON; DOPED MATERIALS; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRONS; ENERGY BEAM DEPOSITION; FIELD EMISSION; MEMBRANES; NANOSTRUCTURES; SEMICONDUCTOR MATERIALS; SILICON; SURFACES
- Descriptors DEC
- BEAMS; DEPOSITION; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; LEPTON BEAMS; LEPTONS; MATERIALS; NONMETALS; PARTICLE BEAMS; SEMIMETALS; SURFACE COATING
Optional Information
- Notes
- (c) 2010 American Institute of Physics