Application of slope-intercept diagram to determine the parameters of the nanocomposite field emitters in-situ

The method of the field emission data online processing of materials, perspective for a nanoelectronics, is developed. The method is based on the slope-intercept diagram analysis of the current voltage characteristics registered during the experiment. It allows to build calibration grids of the microscopic emission parameters, such as work function, effective emission area and field enhancement factor, and and to estimate changes in the sample structure online. (paper)