Sensing of single electrons using micro and nano technologies: a review
- 1. School of Engineering, Griffith University, Gold Coast, QLD 4222 (Australia)
- 2. Department of Precision Instruments, Tsinghua University, Beijing (China)
Description
During the last three decades, the remarkable dynamic features of microelectromechanical systems (MEMS) and nanoelectromechanical systems (NEMS), and advances in solid-state electronics hold much potential for the fabrication of extremely sensitive charge sensors. These sensors have a broad range of applications, such as those involving the measurement of ionization radiation, detection of bio-analyte and aerosol particles, mass spectrometry, scanning tunneling microscopy, and quantum computation. Designing charge sensors (also known as charge electrometers) for electrometry is deemed significant because of the sensitivity and resolution issues in the range of micro- and nano-scales. This article reviews the development of state-of-the-art micro- and nano-charge sensors, and discusses their technological challenges for practical implementation. (topical review)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/aa57aaAdditional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 28
- Journal Issue
- 14
- Journal Page Range
- [15 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50040723
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- AEROSOLS; ELECTROMETERS; IONIZATION; MASS SPECTROSCOPY; MEMS; NEMS; QUANTUM COMPUTERS; RADIATION DETECTION; SCANNING TUNNELING MICROSCOPY; SENSITIVITY; SENSORS; SOLIDS
- Descriptors DEC
- COLLOIDS; COMPUTERS; DETECTION; DISPERSIONS; ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; MICROSCOPY; SOLS; SPECTROSCOPY