Published January 1996
| Version v1
Journal article
Propagation, reflection and refraction of x-rays in matter
Creators
- 1. Inter University Consortium for Department of Atomic Energy Facilities, Indore (India)
Description
The phenomena of reflection and refraction of x-rays using the dielectric formulation is described. Total reflection at small glancing angles is possible due to the refractive index of most materials being less than unity. Some applications of total reflection are discussed explicitly. Additional information of general nature is given in box stories. (author). 6 refs., 2 tabs., 3 figs
Additional details
Publishing Information
- Journal Title
- Physics Education (Madras)
- Journal Volume
- 12
- Journal Issue
- 4
- Journal Page Range
- p. 327-335.
- ISSN
- 0970-5953
- CODEN
- PHEDEB
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 28024287
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- BOUNDARY CONDITIONS; PERMITTIVITY; REFLECTION; REFRACTION; REFRACTIVE INDEX; WAVE PROPAGATION; X RADIATION
- Descriptors DEC
- DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS